Nha, V. Q., L. V. Thang, H. T. Thuy Linh, N. I. Gorbachuk, and N. X. Cuong. “Formation of Radiation-Disturbed Layer in Al/SiO2/N-Si Structures Irradiated With Helium Ions With Energy 5 MeV”. Hue University Journal of Science: Natural Science 129, no. 1D (August 5, 2020): 71-75. Accessed March 29, 2024. https://jos.hueuni.edu.vn/index.php/hujos-ns/article/view/5765.